Characterization of Rare Earth Element Ores with High Spatial Resolution and High Counts Rate with a Field-Emission Scanning Electron Microscope

Rare earth elements play an increasingly important role in renewable energy devices and high-end electronics. In this project, the composition and morphology of REEs-bearing minerals are characterized with a field-emission scanning electron microscope at high spatial resolution and high counts rate using an X-ray silicon drift detector system. High spatial resolution imaging and energy dispersive X-ray microanalysis were applied at low and high magnification to obtain the composition of each phase in the minerals. From the standardless quantitative analysis results, the amount of REEs in each phase was measured and the relationships between those phases were identified.