Electrochemical Characterization Of Chalcopyrite/Solution Interface

The results of an investigation to characterize the chalcopyrite/solution interface are presented. Several techniques including galvanostatic and steady state polarization, cyclic voltammetry and impedance spectroscopy were used. The results show that the dissolution of chalcopyrite is incongruent. Initially, at low potentials(<O.34V), iron species are released which give rise to the growth of an iron-deficient sulfide (IDS) layer. The dissolved iron might reprecipitate as a hydroxide layer depending on solution composition. Continued oxidation involves diffusion of species through the product layer. At higher potentials (>O.48V) further oxidation leads to dissolution of copper and sulfur species with a resultant breakdown of the IDS layer. The changes in properties of surface coatings resulting from various electrochemical treatments are discussed.