Institute of Metals Division - A Study of the Strain Fields Around Intersecting Slip Planes in LiF by X-Ray Extinction Contrast (TN)

DIFFRACTION micrography provides a useful tool for studying complex strain fields. Newkirk1 observed an X-ray diffraction effect due to strain interactions at the intersection of slip lines in LiF and attributed this effect to a reduction of primary extinction due to strain-gradients. It is the object of the current study to correlate the observations and rationalize the appearance of the strain fields around intersecting slip planes in x-ray extinction contrast studies by a semiempirical method. Fig. 1 shows typical strain patterns observed by Newkirk on (200) reflections in LiF using chromium radiation and a variation of the Berg-Barrett (B-B) technique. In other reflections (e.g., {220}) the strain patterns are absent. If one defines a vector 3 along the striations from the more to the less dense portion, and a vector v in the direction of the X-ray beam parallel to the reflecting plane, such that both 3 and v lie in the reflecting plane of the crystal, Fig. 1, then the positions of the striations on (200) reflections appear to be confined such that where is the angle between v and 3, Fig. 1. It will be seen later that 3 is the projection of Sb on the reflecting planes. In some instances the strain effects are observed only above the slip plane, Fig. l(C), in others only below, Fig. l(D). Where the strains appear to be both above and below the slip line, Fig. l(E), one sees that there are actually two slip lines present, Fig. 1(F) and (G). Furthermore, the strain patterns are observed in the vicinity of the intersection of emergent edge dislocations (diagonal lines on the micrograph) with emergent screw dislocations (horizontal lines on the micrograph), e.g., Fig. l(HJ) and (MN), but not in the vicinity of the intersection of two emergent edge dislocation arrays, Fig. l(HJ) and (KL). However, in the latter case the contrast of the dislocation array itself is reduced along (KL) and increased along (HJ). Line (AB) in Fig. 1 is the edge of the crystal, and the material to the left of (AB) is the side of the sample. Any empirical correlation will have to include most, if not all of the aforementioned observations. Lang2 and Newkirk1 determined that the condition for contrast is given by g-b#0 [2] where b is the Burgers' vector and g the diffraction vector (normal to the reflecting planes). If one assumes that the direction of the observed strain fields is given by the vector sum of the slip vectors (Sb1) of the intersecting slip planes, then Eq. [2] may be generalized to g-S#0 [3]