Institute of Metals Division - Determination of Diffusivity of Carbon in Tantalum and Columbium Carbides by Layer-Growth Measurements (TN)

THE rates of growth of the carbide phases MC and M2C in the Ta-C and Cb-C systems have been measured at various temperatures and the results used to estimate the rate of carbon diffusion within the inter metallic phases. Sheets of high-purity tantalum (50 ppm Cb, <25 ppm Ti, 10 ppm Fe, 5 ppm Cr, <50 ppm Mo, W, and all other metals, 15-75 ppm O2, 10-30 ppm N2, and 10-30 ppm C) approximately 1/4 by 1/2 by 0.020 in. were heated to temperatures between 1800" and 2700°C in a carbon resistor furnace under an atmosphere of argon plus sufficient methane to maintain an excess of carbon at the sample surface. The thicknesses of the carbide layers, illustrated in Fig. 1, were measured with a filar micrometer and plotted logarithmically as a function of time. Fig. 2 is a typical plot for the TaC phase. The points may be represented within experimental error by lines with slope equal to 1/2; therefore the growth of the layers may be described by the usual expression X = kt1/2, where X is the layer thickness, t is the time, and k is a temperature-dependent constant. From these data and compositions at the phase boundaries, it is possible to estimate values for the diffusion coefficients of carbon in each phase, assuming that layer growth occurs by carbon diffusion alone, and that the dif-fusivity is not a function of composition within each