Institute of Metals Division - Electron Diffraction Study of Tempered Low-Carbon Martensite

THE nature of the carbides that form during the tempering of martensite is a subject of continuing controversy. The only direct methods of identification available are X-ray and electron diffraction. These methods are subject to several difficulties. Only a relatively few diffraction lines of appreciable intensity emanate from carbide phases that are formed at low tempering temperatures. Furthermore, some overlapping of carbide and matrix lines occurs. There is also the problem that numerous lines in the patterns of possible carbide phases that may be present have about the same d-spacings. Increasing the number of carbide lines and eliminating the matrix lines can be accomplished by extraction techniques. However, there is always the possibility that a change in carbide structure will occur as a result of removal from the parent matrix. Therefore, such techniques as electrolytic extraction and making extraction replicas should be checked by other methods. For identifying small amounts of carbide in a tempered martensitic matrix, electron diffraction carried out in reflection is more advantageous than X-ray diffraction. To properly prepare a specimen for reflection electron diffraction, an etchant that will selectively attack the matrix and thereby cause the carbide particles to stand in relief should be used. With an electron beam directed at a grazing angle to the specimen surface, the major contribution