Institute of Metals Division - Self-Diffusivity Along Edge-Dislocation Singular Lines in Silver

Use was made of a recently developed surface-accumulation diffusion technique to measure the self-diffusivity of edge-type dislocation singular lines (Burgers vector along <110>) in a bent and polygonized single crystal of silver. Two factors are involved in obtaining a number for the diffusivity. One factor, the dislocation-line density, was measured by a microscopic technique recently developed, and the value of the other parameter, the effective "diameter" of a dislocation pipe, was estimated. With these parameters equal to 7.3 X 106 dislocations per sq cm and 10-7 cm, respectively, it was found that the self-diffusivity along edge-type dislocation lines was a factor of about two times the average grain-boundary self-diffusivity. The dislocation-pipe diffusivity is about 7x10-7 sq cm per sec at 450°C. THE possibility of short-circuit diffusion through imperfections in crystals has been recognized for some time. It was only recently, however, that concerted effort has been expended to obtain values of diffusivity for grain-boundary short circuits. The work, for example, of Hoffman and Turnbull1 on silver, Fisher&apos;s&apos; analysis of the grain-boundary dif-