Institute of Metals Division - Some Aspects of Alloying Onto Germanium Surfaces

- Organization:
- The American Institute of Mining, Metallurgical, and Petroleum Engineers
- Pages:
- 6
- File Size:
- 602 KB
- Publication Date:
- Jan 1, 1958
Abstract
THIS paper describes the result of an investigation of the production of thin alloyed layers on a thicker substrate of pure germanium as one step in the manufacture of transistors.' The technique of alloying materials with semiconductors is a means of introducing small amounts of impurity elements in the alloyed regions of the crystal lattice of the semiconductor, the presence of which make possible the junction type transistor.2 Impurity elements are added which will produce regions having differing electrical resistivities and means of carrying current. Impurities are of two types: those which produce an excess of electrons (negative or n-type), and those which produce a deficiency of electrons (positive or p-type) in comparison to the pure semiconductor. The boundary between two such regions is designated a p-n junction. Elements in Group V of the periodic table, having five valence electrons, give rise to an excess of electrons when present substitutionally in the semiconductor lattice (usually germanium or silicon from Group IV). Similarly, elements in Group III create a deficiency of electrons. Germanium and silicon which are substantially free of impurities of either p or n-type are designated intrinsic (i-type) semiconductors. The usual junction ----trarnsistor has
Citation
APA:
(1958) Institute of Metals Division - Some Aspects of Alloying Onto Germanium SurfacesMLA: Institute of Metals Division - Some Aspects of Alloying Onto Germanium Surfaces. The American Institute of Mining, Metallurgical, and Petroleum Engineers, 1958.