Institute of Metals Division - The Effect of Plastic Deformation on the Electrical Resistivity of Composite Silver Alumina Alloys

The increase in electrical resistivity, ?pT,at 78°K was measured as a function of elongation, E, at 78°K for a 2 pct (approximately) by weight finely divided alumina in silver material. The amount of increase in electrical resistivity (?pT) is a function of the amount of alumina present and can be represented by: ?pT = cen where c and n are constants. The constant c increases and the exponent n decreases with increasing alumina content. Approximately 33 pct of the resistivity increase is recovered upon annealing at room temperature. RECENTLY, dispersed phase alloys' have shown promise for use at elevated temperatures. These materials have a high creep resistance, a high-temperature strength considerably above that of the pure matrix, and a high electrical conductivity. These materials also show other properties such as retardation of re crystallization and resistance to flow even above the melting point of the matrix.' It is believed that high-temperature creep is retarded in these materials because the dispersed phase blocks the motion of dislocations. According to schoeck3 and also Weertman,4 the rate controlling process is the climb of dislocations around the dispersed phase particles. Any mechanical property of these materials, or any other material for that matter, can be explained on the basis of defect structures and their interrelations. It would certainly be interesting to learn something about the effect of a dispersed phase on dislocation densities and also their effect on point defect concentrations following cold work. This is the purpose of the research discussed herein. The method used was the measurement of the electrical resistivity as a function of elongation at low temperatures. This scheme has already been applied to the studies of pure metals.5 Electrical resistivity measurements conducted on pure metals such as copper, silver, gold, and so forth, have indicated that defects such as vacancies and dislocations are formed during deformation.5 It has been shown by van Bueren6 that the resistivity change, ?p, should increase with elongation, E, according to the following relation: Ap=Al/2 + B£3/2 where A and B are constants of the system; ?p is in µ? cm. The first term refers to the amount of resistivity change associated with line defects and the second term with the change associated with point defects. A later calculation yielded exponents of 3/4 and 5/4, respectively.6 Manintveld7 has shown that the resistivity of copper increases with strain according to a 3/2 power law, whereas van Bueren has shown that the resistivity of silver increases according to a 5/4 power law. Assuming then that van Bueren's calculations are correct, it appears that line defects contribute very little to the electrical resistivity. There is some doubt, however, as to the validity of van Bueren's expressions for all cubic metals.' In fact, the data on copper and silver are not conclusive. In this in-