Institute of Metals Division - The Quantitative Analysis of Microstructure with Densitometer Data

An automatic system for the quantitative analysis of microstrulcture has been developed. The method is based upon a statistical model of microstructure and employs phase intercept fractions as fundamental random variables. Structure-sensitive properties can be related explicitly to parameters derived from the distribution of phase intercept fractions in a matevial. THE properties of mechanical dispersions and of multiphase alloys art: intimately related to the amount, distribution, and intrinsic properties of the dispersed material. In many instances, the amount and distribution of the dispersed substances have greater influence on the over-all system properties than do the properties of the dispersed substance-Such properties as average particle size, particle size distribution, homogeneity of dispersion, volume per cent of dispersed phase, and mean free path between dispersed particles thus become critical in any evaluation of the properties of a dispersion. Unfortunately, techniques for evaluating quantitatively the microstructural characteristics of dis~ersions rapidly and accurately have not been available. If necessary, qualitative or semiquantitative devices can be utilized. Some such devices are based merely upon comparison of the specimens in question with arbitrary standards. Other techniques involve superposition of grids and tabulation of particles observed in different portions of the grid. Still other methods based upon lineal analysis entail counting lines or points at random upon the specimen to be examined; the number of intersections of the line with a given phase, the proportion of line or number of points which are covered by given phase are variously recorded. The mathematical basis for most of the techniques of quantitative metallography have been amply reviewed in the literature.'l2 without exctption, however, the standard techniques for quantitative metallography are either imprecise or are exceedingly tedious to apply. For example, tranverse integrating stage for rapid manual areal fraction measurement has been designed by Smith.3 Howerer, as in the case of any device based upon visual eslimation, operator bias may cause appreciable error. Various flying spot devices, on the other hand register particle size distributions in 2-dimensions, from which it is difficult to derive other properties of the dispersion. Thus, e.g., the 3-dimensional distribution cannot be inferred unless certain rather broad assumptions are made concerning the randomness of distribution and geometrical configuration of dispersed phase. Many limitations to the application of quantitative structural analysis can be overcome by the use of the microdensitometer, which is essentially an automated areal analysis device. Data obtained in the form of a distribution of phase intercept values are