Institute of Metals Division - The Thickness of the Residual Liquid Layer on a Decanted Interface of Tin (TN)

In developing a mechanism for the solidification of metals from the melt, it has been proposed that solidification proceeds by the growth of platelets parallel to close packed planes. The evidence for this is based primarily on observations of decanted interfaces of lead1,2 and tin on which platelets 1 to 10 µ thick4 were observed. In recent observations of decanted eutectic alloys, 5,6 it was found that the eutectic structure on the decanted surface was markedly different than that of the bulk material, with the surface structure extending approximately 10 µ behind the interface.' This suggested that, at least for these experiments, a residual liquid layer 10 µ thick had been left on the decanted interface, which solidified subsequent to decanting. If a similar thickness of residual liquid was left on the decanted surfaces in the lead and tin observations referred to above, then it is questionable to what extent the observed platelets can be related to the solid-liquid interface before decanting. The purpose of the present investigation was to measure the thickness of the residual liquid layer on a decanted surface of tin, using relatively standard decanting procedures. The technique used was to add approximately 200 ppm of Tl204 (PI) to the melted portion of a high purity (99.999 pet) bar of tin, which was being progressively melted from one end, and then decant during melting. Since only the melt contained the radioactive tracer, the activity emanating from the decanted surface could be used as a measure of the thickness of the residual liquid layer. Progressive melting was carried out in the same fashion as single crystal growth, namely, in a horizontal graphite boat, in an argon atmosphere, using a moving furnace. The decanting was done in two ways; 1) removing the furnace and suddenly dropping the melt end of the boat, and 2) suddenly jerking the solid away from the liquid by the action of a falling weight (estimated peak acceleration 3 x 105 cm per sq sec), using a split graphite container. In all cases the melt was vigorously agitated by bubbling argon through it. The activity of the decanted surface was measured through an aperture 1.5 cm by 0.5 cm in a lead shield with an Anton tube geiger counter. Assuming that the active layer on the surface had the same concentration of Tl204 as the decanted liquid, the thickness of the layer could be determined from the measured activity of the decanted material, and the relationship between activity and material thickness. The latter was determined by rolling some of the decanted material into foil and measuring the activity of multiple layers of the foil. The activity At of material of thickness t (in mm) was determined to be A, = Ao(1 - e-22.5t) where Ao is the activity of the bulk material. The results of the measurements of the thickness of the residual liquid layer for six decants are given in Table I. The variation in t is attributed to variations in the decanting procedure and the rate of melting, the latter being difficult to control because of the vigorous agitation of the liquid. The rate of melting was in the order of 2 cm per hr, estimated from the position of the solid-liquid interface during melting. The results indicate that a residual liquid layer of the order of 10 µ in thickness is left on the decanted interface in agreement with the observation on eutectic alloys referred to above. If the mixing of the liquid during melting is not complete, as was