Iron and Steel Division - An X-Ray Reflection Micrographic Method for Measuring Subgrain Boundary Angle

A method for determining the disorientation between sub-grains that .share a common tilt or twist boundary from measurements on X-ray micrographs is described. The method may be applied to subgrains of almost any orientation having boundary angles in the range from about 1 min to 1 deg of arc. An adaption of the Berg-Barretl method has been made to allow calculation of small angles of about 1 min to 1 deg of arc: between adjacent subgrains from the relative displacement of their images on X-ray micrographs. schulz4 gave equations for determining subgrain disorientation where the axis of subgrain rotation and the reflecting crystal planes were parallel to the specimen surface. In our method, however, they need not be parallel and, indeed, may have va:rious orientations. His camera setup, involving a fine-focus X-ray tube for obtaining high resolution with continuous radiation, was different from the one used in the present investigation (a 1.2 x 1.2 mm effective source and characteristic radiation). The X-rays produced a slight magnification in the subgrain images in the Schulz method, but not in the present method. The commonly available type of X-ray tube used permitted relatively short exposure times with a fine-grained photographic plate, which could be magnified optically many times for the examination of small subgrains. The method is illustrated by results obtained on {110} tilt boundaries in a polygonized aluminum single crystal of 99.994 pct purity. The flat crystal was stretched 6 pct in tension and then heated at 500°C for a cumulative time of 5 hr. Earlier, cahn5 studied subgrains formed by polygonization in stretched and heated aluminum crystals. He observed kink bands to have well defined boundaries lying in (110) planes, at least in the early stages of deformation. Cahn found that the (110) tilt boundaries formed by polygonization were directly related to the lattice bending about the <211> axis which lay in the (111) slip plane perpendicular to the <110> slip direction. DESCRIPTION OF THE CAMERA Our camera was similar in detail to Honey-combe&apos;s.6 Unfiltered copper radiation was used at 35 kv, and 20 ma. With the particular specimen used here to illustrate the method, a 1.2 by 1.2 mm effective source and a distance of 780 mm from target to specimen were employed, giving a convergence of 5 min of arc in the primary beam. The distance was 9.5 mm from the specimen to film. The upper 1/2- by 1-in. portion of the front surface of the specimen was irradiated with the film in parallel position. Since the specimen had been inhomogeneously deformed, many regions were in a position to reflect characteristic radiation at the Bragg Angle. Five minute exposures were satisfactory with Kodak Single Coated X-ray Film, 1 1/2 hr