Microstructure Evolution in Aluminum During Large Hot Torsion Strains

Canadian Institute of Mining, Metallurgy and Petroleum
G. Avramovic-Cingara H. J. McQueen
Organization:
Canadian Institute of Mining, Metallurgy and Petroleum
Pages:
14
File Size:
2485 KB
Publication Date:
Jan 1, 2006

Abstract

The microstructure of commercially pure aluminum was investigated by using polarized optical microscopy (POM), orientation imaging microscopy (OIM), and transmission electron microscopy (TEM) techniques. Specimens were deformed in torsion at 400°C and equivalent strain rate of 0.1 s-1, to various strains of 0.2, 0.5, 1, 4, and 6. The results indicate that POM can usefully reveal grain and subgrain structures over a large field in aluminum. TEM is most suitable to study dislocation substructure and evolution of subgrains. While TEM microscopy and OIM are capable of resolving individual subgrains, OIM can not reliably distinguish subgrains with small misorientations, particularly in samples with low strain. On the other hand, the OIM technique is very useful in the analysis of many regions surrounded by high, medium, and low angle boundaries (HAB, MAB, LAB). Various misorientation maps were studied using different data processing methods. The analysis revealed that the subgrain size is relatively insensitive to strain. The fraction of low LAB ( < 5°) decreased and HAB (>15°) increased conversely with increasing strain, whereas MAB (5-15°) remained stable. The development of an increasingly bimodal grain boundary misorientation distribution is consistent with the predominance of dynamic recovery (DRV) in the evolution of microstructure, combined with geometrical dynamic recrystallization (gDRX), now called grain-refining DRV.
Citation

APA: G. Avramovic-Cingara H. J. McQueen  (2006)  Microstructure Evolution in Aluminum During Large Hot Torsion Strains

MLA: G. Avramovic-Cingara H. J. McQueen Microstructure Evolution in Aluminum During Large Hot Torsion Strains. Canadian Institute of Mining, Metallurgy and Petroleum, 2006.

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