OFR-60-82 TDRM Testing

This report describes in detail the circuitry used in the Automated Time Domain Reflectometry System and the testing and modification done to the system to improve the units performance and consistency. The analog ATDR software is described and explained in detail. Also attempts to implement the same Assembly Language program in a higher level language (PLM) are documented along `h two versions of the PLM program - one which uses a data filtering approach to limit noise and another which uses data averaging to reduce noise. The field testing of the analog and digital ATDR units is described along with the hardware modifications that resulted. The analog unit has been abandoned and the digital unit adopted for most field tests. Tests indicate that the digital units are much more consistent and less confusing for the lay-person to operate. The results indicate that the it can locate an abnormality in a test cable to within 5% of the true location (provided the cable phase velocity is known). The units can consistently locate shunt type faults which are less than 300 ohms and series type faults which are greater than 30 ohms.