Oxidation And Wetting Behavior Of Chalcopyrite In The Absence And Presence Of Xanthates (19122482-d495-4d21-9d6f-d8ecc253cb50)

The mechanisms of chalcopyrite oxidation in alkaline solutions have been studied using cyclic voltammetry and AC impedance spectroscopy techniques. Analysis of the impedance spectra using equivalent circuit models has made it possible to suggest layerwise growth of surface films. From the value of equivalent circuit parameters, properties of the surface layers are inferred. These properties change substantially with the change in oxygen and/or collector concentration in solution and give rise to changes In contact angle and flotation response. In agreement with prior investigations, the present study shows that flotation recoveries alone cannot be used to determine the effect of collector on flotation of chalcopyrite. The rate of flotation is a more sensitive parameter to determine the role of collector on floatability of chalcopyrite.