Part I – January 1968 - Communications - The Preparation of Fine Recrystallized Tungsten Wire for Transmission Electron Microscopy

- Organization:
- The American Institute of Mining, Metallurgical, and Petroleum Engineers
- Pages:
- 4
- File Size:
- 479 KB
- Publication Date:
- Jan 1, 1969
Abstract
In a study of the structure and properties of tungsten wire used for lamp filaments, it became desirable to perform transmission electron microscopy on the wire in the annealed as well as in the drawn condition. Wire used for lamp filaments is generally drawn to diameters less than 0.010 in. which is too fine for the preparation of transmission samples from single wires. Thus, it is clear that some assembly of wires must be used to form a "wire sheet" similar to that used by Glenn and Duff.' Also, because recrystallized tungsten wire is brittle at room temperature, the "wire sheetJ' must be rigidly contained during any subsequent grinding and polishing operation. With these conditions in mind, a technique was devised for thinning tungsten wire of 0.001 to 0.010 in. diam for transmission electron microscopv. Sample Preparation. The commercially doped (218) tungsten filament wire was obtained from the Lamp
Citation
APA:
(1969) Part I – January 1968 - Communications - The Preparation of Fine Recrystallized Tungsten Wire for Transmission Electron MicroscopyMLA: Part I – January 1968 - Communications - The Preparation of Fine Recrystallized Tungsten Wire for Transmission Electron Microscopy. The American Institute of Mining, Metallurgical, and Petroleum Engineers, 1969.