Part II – February 1969 - Communication - Line Intensities in Proton Scattering Patterns

WhEN a collimated beam of protons or other energetic particles is scattered by a single crystal, the emerging particles produce patterns that contain much crystallographic information. Calculations of the trajectories of individual particles can predict with reasonable accuracy the complete pattern (which is related reciprocally to channeling, now studied in detail6) but the task is a lengthy one which has been completed for very few cases. A many-beam dynamic diffraction calculation of the patterns would be even more difficult and in some cases may be invalid. Because of these complexities, simple methods that will predict to a rough approximation the relative intensities of the lines in films of the back-scattering patterns of a given crystal are wanted. I have found a method which, although it is not a valid computation of intensities or of film darkening by either dynamic or kinematic diffraction principles or by trajectory calculations, nevertheless is found to be useful in practice. It has been tested on several crystal types,7 and is here tested on additional ones. The method consists in first calculating the structure factor F(hk1) for the (hkl) plane, of spacing d, by the familiar equation: where the summation extends over the atoms in the unit cell and fj is the atom scattering factor of the jth atom (using tables computed for electron diffraction, preferably those computed without exchange). Then the F values are squared and summed over all the orders, n, for which F2 has an appreciable value, giving a quantity: Finally, I, is expressed as a percentage of Ic for the