Part VII – July 1968 - Communications - Composition and Structure of Silicide Precipitate in Complex Titanium (6Al-3Sn-3Zr)-Silicon Alloys

THE increased demand for titanium alloys with improved high-temperature creep strengths has stimulated interest in silicon as an alloying addition to titanium. Silicon is a potent solid-solution strength-ener and, if added in sufficient concentration and properly heat-treated, can also dispersion-strengthen titanium by eutectoid decomposition.' However, better understanding of the nature and distribution of the resulting silicide dispersion in more highly alloyed titanium matrices is necessary for the development of useful titanium alloys which utilize the latter strengthening mechanism. This note describes the chemical and crystallographic characteristics of the silicide phase as it occurs in a typical high-temperature near-a titanium alloy matrix. Several Ti-6A1-3Sn-3Zr a11oys containing various amounts of silicon ranging from 0.1 to 1.0 pct were melted as 10- to 20-lb ingots and processed into 1/2-in.-diam bar stock. The microstructures of specimens annealed at various temperatures were conveniently summarized by the (Ti-6Al-3Sn-3Zr)-Si pseudobinary phase diagram illustrated in Fig. 1. Comparison with the Ti-Si equilibrium diagram indicates the substitutional solutes (Al-Sn-Zr) increase the eutectoid temperature and decrease the a terminal solubility. Annealing at temperatures sufficiently high to dissolve the silicon in a ß solid solution and cooling rapidly enough to preclude coarsening generally produced a uniform dispersion of fine silicide particles, whereas annealing at temperatures near but below the ß transus produced relatively coarse silicide particles. Annealing in the limited a, plus 3 region produced a duplex coarse and fine silicide array. Several a-annealed specimens were examined by X-ray diffraction to determine the crystallographic identity of the precipitate phase. Copper Ka X-ray diffraction patterns of bulk specimens which contained 0.5 and 0.8 pct Si were virtually identical to that of the silicon-free Ti-6Al-3Sn-3Zr base alloy except for a slight shift in some of the high-angle diffraction lines. Apparently the silicide volume fraction was too low to be detected in bulk specimens. X-