Poorly-diffracting Material as a Trace Element Repository

X-ray diffraction techniques are commonly used in the identification and quantification of fine-grained materials. A relationship exists between the size of crystals in a sample and the degree to which they diffract X-rays. The Scherrer equation relates the broadness of diffraction peaks to the size of crystals responsible for diffraction (Klug and Alexander, 1974). Relatively large crystals of the order of I - 10 ¦m strongly diffract X-rays; the diffractogram of such crystals exhibit narrow intense peaks. As the size of the crystals in a sample is reduced, diffraction peaks become broader and less intense. Crystals less than 10 nm generally exhibit broad, diffuse and low intensity peaks. Some material is so fine-grained and poorly-diffracting that X-ray patterns show very little information in a normal one-hour scan thereby necessitating very long acquisition times of up to 12 hours. The term poorly-diffracting material (PDM) was coined for such material found within the bauxite deposit of Weipa, northern Queensland (Tilley and Eggleton, 1994; 1996). Common regolith minerals such as hematite, goethite and layer silicate clays are quite commonly fine enough to possess a poorly-diffracting character. Noncrystalline and poorly crystalline Fe-Si-Al-oxyhydroxides such as allophane, opal, ferrihydrite and hisingerite, have either a nondiffracting (amorphous) or poorly-diffracting nature (Eggleton, 1987).