Practical Applications For The Silicon Drift X-Ray Detector In SEM-Platformed Image Analysis: The Bruker-MLA In Practice

Preface The intention of this paper is to provide the reader with knowledge gained here at Memorial University regarding the practical use of the Bruker SDD x-ray detector for applications in image analysis. Included below are descriptions of the detector’s characteristics and observations regarding precautionary use. What is described below is relevant to the XFlash® model 3001 detector only, whereas the model 4010 is the new and currently available detector. The manufacturer has provided up-to-date information and a figure that presents very different behaviour relative to the characteristics described in this paper. That information and figure is also included here as an addendum (see figure 9). Introduction It has been more than two decades since an image analyzer has been proposed based on the unique imaging characteristics and spatial resolution provided by the scanning electron microscope (SEM) together with energy discriminating x-ray (EDX) acquisition (Reid et al, 1984). From the inception of technique, technology of the day has played the major role for making applications increasingly more practical. Computers, digital imaging, and softwares together with computer automation of modern digital SEMs have all played their part in advancing the technique to where it is today.