Quantitative X-ray Diffraction Analysis of Trace Quartz in Selected Mineral Products: Standardization II.

Society for Mining, Metallurgy & Exploration
Jacques Renault Chris McKee James Barker
Organization:
Society for Mining, Metallurgy & Exploration
Pages:
2
File Size:
137 KB
Publication Date:
Jan 1, 1991

Abstract

Previous XRD work by us (McKee, Renault, Barker; 199Oa, 1990b) showed that by using pressed powder briquettes and a peak deconvolution technique, quartz in perlite can be routinely determined at <0.1 wt. %. In the present report, we discuss two additional methods of standardization: 1) chemical determination of quartz in silicate standards and 2) addition of a large amount of quartz to an unknown mixture. The first method applies the concept of mass balance and is sensitive to the analysis of silica and a monitor element. The second minimizes mixing errors; its equation is non-linear and is derived from the two component case with unequal mass absorption coefficients treated by Klug and Alexander (1974).
Citation

APA: Jacques Renault Chris McKee James Barker  (1991)  Quantitative X-ray Diffraction Analysis of Trace Quartz in Selected Mineral Products: Standardization II.

MLA: Jacques Renault Chris McKee James Barker Quantitative X-ray Diffraction Analysis of Trace Quartz in Selected Mineral Products: Standardization II.. Society for Mining, Metallurgy & Exploration, 1991.

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