Redox Potential Dependence of Chalcopyrite Leaching (efe1695f-0ff5-4a1f-83c2-d23dbd863027)

International Mineral Processing Congress
Naoki Hiroyoshi Masami Tsunekawa Tsuyoshi Hirajima Hajime Miki
Organization:
International Mineral Processing Congress
Pages:
11
File Size:
290 KB
Publication Date:
Jan 1, 2003

Abstract

Acidic solutions for chalcopyrite leaching contain cupric, ferrous and ferric ions, and the oxidizing power of the solutions is indicated by a redox potential, determined by the concentration ratio of ferric to ferrous ions. This paper reviews our previous studies on the redox potential dependence of chalcopyrite leaching in sulfuric acid solutions. Leaching and anodic-polarization experiments showed that coexistence of cupric and ferrous ions activate anodic dissolution of chalcopyrite, causing faster copper extraction at the potentials below a certain value (critical potential). The analysis of the AC impedance spectra for chalcopyrite electrode indicated that a high-resistance passive layer grows on the chalcopyrite surface without cupric and/or ferrous ions, and that coexistence of these ions causes a formation of another product layer and inhibits the passive layer growth at low potentials. These results are explained by a reaction model assuming the formation of intermediate Cu2S due to chalcopyrite reduction and the subsequent oxidation of the Cu2S. The critical potential corresponds to the redox potential of the Cu2S formation and the predicted values matched with the experimental results. Catalytic effect of silver ions on chalcopyrite leaching was also discussed based on experimental results and the above model.
Citation

APA: Naoki Hiroyoshi Masami Tsunekawa Tsuyoshi Hirajima Hajime Miki  (2003)  Redox Potential Dependence of Chalcopyrite Leaching (efe1695f-0ff5-4a1f-83c2-d23dbd863027)

MLA: Naoki Hiroyoshi Masami Tsunekawa Tsuyoshi Hirajima Hajime Miki Redox Potential Dependence of Chalcopyrite Leaching (efe1695f-0ff5-4a1f-83c2-d23dbd863027). International Mineral Processing Congress, 2003.

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