Reflectance Spectroscopy with X-Ray Fluorescence for Rapid Slurry Analysis

"Accurate on-line assays of mineral slurries are the basis for effective operation of flotation circuits. Typically the elemental content measurements are obtained by an X-ray fluorescence (XRF) analyzer, which samples the process lines and performs the analysis concurrently line-by-line. For a more frequent measurement of each slurry line the XRF measurements can be complemented with reflectance spectrum information. In reflectance spectroscopy the absorbance properties of the slurry in the visible and near-infrared wavelength range are analyzed. The advantage of reflectance spectroscopy is that measurements can be obtained quickly and simultaneously from several slurry lines. However, since the shape of the spectrum is only indirectly affected by the slurry elemental contents, frequent calibration of the measurement against the XRF analyzer is necessary. This study elaborates the combination of reflectance spectrum analysis with XRF. Results of laboratory tests for different slurries are presented and the operation of the system in a copper-zinc flotation plant is demonstrated.IntroductionElemental analysis of mineral flotation slurries is the most important factor in evaluating the performance of concentration processes. Timely on-line assays are also used as the basis for controlling the circuits and ensuring that the grade and recovery targets are reached. X-ray fluorescence (XRF) is the dominant technology in on-line elemental slurry analysis, and typically centralized XRF analyzers are used. The advantage of a centralized analyzer is that one measurement probe can be used to acquire the data from several slurry lines. This reduces the overall operating cost of the system when compared to distributed analyzer system design with several measurement probes requiring maintenance and spare parts. Slurry samplers are installed in the interesting process flows and representative sample flows are brought to the analyzer, where the slurry is further sampled and measured consecutively by the XRF analyzer. Due to the centralized structure of the analyzers and consecutively measurement of the sampling lines the sampling interval per slurry line can be relatively long. In larger concentration plants with several sampling lines a typical assay interval is in the range of 10-20 minutes."