RI 5966 Fluorescent X-Ray Spectrography: Determination Of Trace Elements ? Introduction And Summary

The National Institute for Occupational Safety and Health (NIOSH)
William J. Campbell
Organization:
The National Institute for Occupational Safety and Health (NIOSH)
Pages:
34
File Size:
8432 KB
Publication Date:
Jan 1, 1962

Abstract

The purpose of this investigation was to extend the analytical services which are required for Bureau of Mines programs in developing and evaluating high-purity materials. Determination of trace elements in minerals and ores as an aid in geochemical evaluation and prospecting was considered. Serious consideration should be given to the merits of using the avail- able fluorescent X-ray spectrographic instrumentation and techniques for determining trace elements. Limits of detectability for trace elements in metal, oxide, solution or mineral samples range from 0.1 to 100 p.p.m, depending on the element being determined, overall sample composition, and the complexity of the X-ray spectra; limits of detectability range from 0.01 to 1 microgram for elements that have been preconcentrated by a chemical or physical process, for example, by ion-exchange membrane.
Citation

APA: William J. Campbell  (1962)  RI 5966 Fluorescent X-Ray Spectrography: Determination Of Trace Elements ? Introduction And Summary

MLA: William J. Campbell RI 5966 Fluorescent X-Ray Spectrography: Determination Of Trace Elements ? Introduction And Summary. The National Institute for Occupational Safety and Health (NIOSH), 1962.

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