RI 6483 X-Ray Spectrographic Analysis for Trace Quantities of Tantalum in Columbium
- Organization:
- The National Institute for Occupational Safety and Health (NIOSH)
- Pages:
- 18
- File Size:
- 381 KB
- Publication Date:
- Jan 1, 1964
Abstract
With suitable instrumentation and techniques it is possible to determine
the presence of tantalum in columbium to 20 ppm . This paper discusses the
selection of X- ray spectrographic instrumentation and describes a technique
for accomplishing the low level determination of tantalum . An ion- exchange
method of separating tantalum from columbium is also described .
Citation
APA: (1964) RI 6483 X-Ray Spectrographic Analysis for Trace Quantities of Tantalum in Columbium
MLA: RI 6483 X-Ray Spectrographic Analysis for Trace Quantities of Tantalum in Columbium. The National Institute for Occupational Safety and Health (NIOSH), 1964.