SIMS Study Of Metal Ion Activation In Gangue Flotation (5273a6ff-59e8-4b92-81ad-05d9be7d276e)

Society for Mining, Metallurgy & Exploration
D. R. Nagaraj
Organization:
Society for Mining, Metallurgy & Exploration
Pages:
7
File Size:
635 KB
Publication Date:
Jan 1, 1995

Abstract

Secondary Ion Mass Spectroscopy (SIMS) was used to study copper ion adsorption, and its effect on subsequent sulfide collector adsorption, on pyrite and pyroxene minerals under flotation related conditions. Copper was found to adsorb on both of these minerals and cause enhanced sulfide collector adsorption. The distribution and depth profile of copper and collector on these mineral surfaces were obtained by using SIMS in the imaging mode. The results of this study have provided a valuable insight to understanding pyrite and gangue flotation observed frequently in operating plants.
Citation

APA: D. R. Nagaraj  (1995)  SIMS Study Of Metal Ion Activation In Gangue Flotation (5273a6ff-59e8-4b92-81ad-05d9be7d276e)

MLA: D. R. Nagaraj SIMS Study Of Metal Ion Activation In Gangue Flotation (5273a6ff-59e8-4b92-81ad-05d9be7d276e). Society for Mining, Metallurgy & Exploration, 1995.

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