Solving Mineral Processing Problems with Advanced Surface Science Techniques

Sufficient development of the X-Ray Photoelectron Spectroscopy (XPS), the Auger Electron Spectroscopy (AES), and the Secondary Ion Mass pectroscopy (SIMS) has made these instruments ideal for solving problems related to mineral processing -particularly gold ore processing. XPS can determine both the surface composition and chemistry of ores and tailings, and the various phases within either of them. AES can also determine surface composition with the further advantage of having greater spatial resolution so the surface chemistry associated with specific minerals in the ore can be identified. This identification helps to clarify why some minerals pass through a chemical process unaffected, while others can be successfully treated. SIMS has an elemental sensitivity from one to four orders of magnitude greater than XPS or AES which makes it useful for detecting the presence of some elements in very low concentration (parts per million).