Sum Frequency Spectroscopy Reveals New Possibilities To Study Interfaces

Society for Mining, Metallurgy & Exploration
Z. S. Nickolov J. D. Miller
Organization:
Society for Mining, Metallurgy & Exploration
Pages:
6
File Size:
534 KB
Publication Date:
Jan 1, 2004

Abstract

Sum Frequency Spectroscopy (SFS) is a powerful nonlinear optical technique to study interfaces at the molecular level. SFS has one major advantage over conventional vibrational spectroscopic methods, such as infrared (IR) absorption and Raman scattering, in that the method is inherently interface specific. As a result, the spectroscopy of molecules residing in the interfacial region can be probed selectively without any contributions from the molecules present in the more pervasive bulk phases. Analysis of SF spectra can yield information on population, structure, and orientation of interfacial species with several nanometers in-depth resolution. The recently acquired SF spectrometer at the University of Utah opens new possibilities for investigation of interfacial phenomena of great importance for separation technology, materials research, nanotechnology, bioengineering. Its application to studies of liquid/gas, solid/liquid, and solid/gas interfaces will be discussed.
Citation

APA: Z. S. Nickolov J. D. Miller  (2004)  Sum Frequency Spectroscopy Reveals New Possibilities To Study Interfaces

MLA: Z. S. Nickolov J. D. Miller Sum Frequency Spectroscopy Reveals New Possibilities To Study Interfaces. Society for Mining, Metallurgy & Exploration, 2004.

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