Tof-SIMS Surface Analyses as a Diagnostic and Predictive Tool for Mineral Processing: New Developments and Applications

Canadian Institute of Mining, Metallurgy and Petroleum
Brian Hart Stamen Dimov
Organization:
Canadian Institute of Mining, Metallurgy and Petroleum
Pages:
22
File Size:
662 KB
Publication Date:
Jan 1, 2010

Abstract

"The Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS) is unique in that it measures the outermost atomic layers of any material. The technique is particularly suited for determining surface chemical composition of mineral particles. It is most commonly used as a diagnostic tool to measure mineral surface chemical variability in plant and bench top flotation separation processes. Recently, research towards understanding the full capability of the instrument has resulted in the development of new diagnostic applications related to various Au extraction technologies and the development of the ToF-SIMS as a predictive tool for assessing the chemical reactivity of the ore.In this paper we will present a brief review of the ToF-SIMS technique with recent advances in instrumentation and methodologies including:•,?recent developments and advances towards a semi-quantitative approach to the evaluation of mineral surface modifiers (ex. Cu),•,?flotation case studies investigating activator, depressant and collector loading variability within a flotation process,•,?the recently developed chemical reactivity test which we believe has the potential to predict the behaviour of minerals in a flotation test in response to chemical transfer during grinding,•,recent applications for determination of surface Au preg-robbed in carbonaceous materials.A portion of this material has been recently presented at the COM 2009 meeting and at SIMS XVII (see Dimov et al 2009 and Hart et al, 2009).INTRODUCTIONIn flotation seperation surface chemistry is the principal determinant for selective separation of the various mineral phases (Ralston, 1994, Smart et al, 2003). Determination of this hydrophobic/hydrophilic balance by particle therefore requires correct identification and selection of the particular mineral phase(s) followed by a statistical analysis of the surface chemical characteristics of the particles with an estimation of the spread of values (Smart et al, 2003)."
Citation

APA: Brian Hart Stamen Dimov  (2010)  Tof-SIMS Surface Analyses as a Diagnostic and Predictive Tool for Mineral Processing: New Developments and Applications

MLA: Brian Hart Stamen Dimov Tof-SIMS Surface Analyses as a Diagnostic and Predictive Tool for Mineral Processing: New Developments and Applications. Canadian Institute of Mining, Metallurgy and Petroleum, 2010.

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