Trace element variation in galena crystals - Mississippi Valley-type deposits

Twenty-six in situ analyses of cubic galena crystals from a Mississippi Valley-type deposit were undertaken with a laser microprobe emission spectrograph to study the variation of nine trace elements from the crystal center to its periphery, both along the diagonal and vertical. The general trend is an outward increase in the concentrations of Ag, Ga, Ge and In, with As showing the opposite trend. Bi, Cd and Sn showed no discernable trends. Sb was not detected. These variation patterns may serve as a model for similar studies of other Mississippi Valley-type deposits.