Using Rietveld analysis with TOPAS for modal analysis of geological samples

X-ray diffraction has long been used for qualitative and quantitative mineral analysis but Rietveld data analysis is still an under utilized method for mineral exploration and processing applications. In this full-profile approach the structural parameters of each mineral phase, together with experimental parameters, are refined by least-squares methods to minimize the difference between observed and calculated diffraction patterns. The result is a standard-less, quantitative analysis of the mineral abundance in the sample that is more accurate and considerably faster compared to traditional methods. The TOPAS software package combines a user-friendly interface with a unique approach to resolve overlapping peaks. Automated analysis options are also available and significantly reduce analysis time for routine samples. Several examples on a wide range of naturally occurring rock types are shown that illustrate the capabilities and limitations of the method. The examples include several options for the quantification of amorphous constituents like volcanic glasses.